Thermal & Loss Parameters¶
Loss and thermal checks for dielectric, conductor, substrate, TLS, radiation, and package-related dissipation.
# |
VER ID |
Parameter |
Severity |
Design Rule / Constraint |
Ideal / Optimal Value |
Acceptable Range |
Good |
Bad |
Why It Matters |
|---|---|---|---|---|---|---|---|---|---|
41 |
HFSS-T-001 |
Dielectric Loss Tangent |
Critical |
tan δ < 10⁻⁶ (bulk substrate, Si or Al₂O₃) |
< 10⁻⁶ |
10⁻⁷ – 10⁻⁵ |
< 10⁻⁶ (Si/sapphire): substrate contribution to T₁⁻¹ < 1 kHz; Q_i > 10⁶ |
> 10⁻³ (SiO₂, organics): dielectric loss dominates; T₁ < 1 µs; unacceptable |
Bulk dielectric loss factor. Mandates high-resistivity Si or c-plane sapphire; amorphous oxides and organics are lossy. |
43 |
HFSS-T-003 |
Dissipated Power P_sub |
High |
P_sub < 1 pW per qubit at design drive level |
< 0.1 pW |
0.1 – 100 pW |
< 0.1 pW: quasiparticle generation rate negligible; T₁ not QP-limited |
> 1 nW: significant quasiparticle poisoning; T₁ collapses in µs timescale |
Power deposited in substrate at millikelvin temperatures. Excess heating raises quasiparticle population, reducing T₁. |
44 |
HFSS-T-004 |
Thermal NEP |
Medium |
NEP < 10⁻²⁰ W/√Hz at qubit frequency (20 mK) |
< 10⁻²⁰ W/√Hz |
10⁻²⁰ – 10⁻¹⁸ |
< 10⁻²⁰: thermal photon occupancy n_th < 10⁻³; qubit not spuriously excited |
> 10⁻¹⁶: near-classical noise floor; qubit excited multiple times per measurement cycle |
Thermal noise equivalent power at qubit frequency. Drives spurious qubit excitation and sets fundamental measurement noise floor. |
45 |
HFSS-T-005 |
TLS Loss Rate 1/T₁_TLS |
Critical |
1/T₁_TLS < 1 kHz (TLS contribution to decay) |
< 0.5 kHz |
0.5 – 10 kHz |
< 0.5 kHz: TLS loss gives T₁_TLS > 2 ms; not limiting coherence budget |
> 100 kHz: TLS dominates all other T₁ channels; requires redesign |
Decay rate contribution from two-level system defects at metal–substrate, metal–air, and substrate–air interfaces. |
46 |
HFSS-T-006 |
Conductor Loss α_c |
Medium |
α_c < 0.001 dB/m in SC resonator lines |
< 0.0001 dB/m |
0.0001 – 0.1 dB/m |
< 0.0001 dB/m: ohmic loss negligible vs radiation and TLS loss in SC lines |
> 1 dB/m: conductor loss dominates; normal-metal sections or damaged SC film |
Ohmic attenuation per unit length. Negligible in good superconductors far below Tc; dominant in normal metal or granular films. |
47 |
HFSS-T-007 |
Package Radiation Loss 1/Q_rad |
High |
1/Q_rad < 10⁻⁷ (shielded package) |
< 10⁻⁷ |
10⁻⁷ – 10⁻⁵ |
< 10⁻⁷: radiation Q > 10⁷; package does not limit resonator or qubit Q |
> 10⁻⁴: radiation loss comparable to TLS loss; package seams/vias must be redesigned |
Inverse radiation Q. Power fraction radiated from chip to environment via package seams, slots, and via fields. |